JASN -- Index by Author (, 13, Number 2)

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Index by Author: ; 13 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Michiaki [Abstract] [Full Text]; Alpers, Charles E. [Abstract] [Full Text]; Arima, Shuji [Abstract] [Full Text]
B: Bacchetti, Peter [Abstract] [Full Text]; Basora, Nuria [Abstract] [Full Text]; Beato, Francisca [Abstract] [Full Text]; Benedetto, Francesco Antonio [Abstract] [Full Text]; Berger, Urs V. [Abstract] [Full Text]; Bertram, John F. [Abstract] [Full Text]; Bhambra, Upinder [Abstract] [Full Text]; Böger, Rainer [Abstract] [Full Text]; Bonham, Rita [Abstract] [Full Text]; Borrelli, Michael J. [Abstract] [Full Text]
C: Cangro, Chuck [Abstract] [Full Text]; Cattran, Daniel C. [Abstract] [Full Text]; Cerullo, Giuseppina [Abstract] [Full Text]; Chan, John S. D. [Abstract] [Full Text]; Chauveau, Dominique [Abstract] [Full Text]; Chen, Xing [Abstract] [Full Text]; Chidambaram, Mala [Abstract] [Full Text]; Christensen, Erik I. [Abstract] [Full Text]; Cook, H. Terence [Abstract] [Full Text]; Couser, William G. [Full Text]; Craig, Kathrine J. [Abstract] [Full Text]; Cui, Yan [Abstract] [Full Text]; Curhan, Gary C. [Abstract] [Full Text]
D: D’Altri, Christian [Abstract] [Full Text]; Dai, Chunsun [Abstract] [Full Text]; Danovitch, Gabriel M. [Abstract] [Full Text]; Darré, Silvina [Abstract] [Full Text]; de Fijter, Johan W. [Abstract] [Full Text]; De Prez, Eric G. [Abstract] [Full Text]; De Vriese, An S. [Abstract] [Full Text]; Debelle, Frédéric D. [Abstract] [Full Text]; Deschodt-Lanckman, Monique M. [Abstract] [Full Text]; Dong, Victor M. [Abstract] [Full Text]; Douglas-Denton, Rebecca [Abstract] [Full Text]; Droz, Dominique [Abstract] [Full Text]; Duncan, John A. [Abstract] [Full Text]; Dunn, Ashley R. [Abstract] [Full Text]
E: Eddy, Allison [Full Text]; Eitner, Frank [Abstract] [Full Text]
F: Fakhouri, Fadi [Abstract] [Full Text]; Fallon, Maureen [Abstract] [Full Text]; Feinstein, Sofia [Abstract] [Full Text]; Filep, Janos G. [Abstract] [Full Text]; Floras, John S. [Abstract] [Full Text]; Flügel, Alexander [Abstract] [Full Text]; Frishberg, Yaacov [Abstract] [Full Text]; Fuchshuber, Arno [Abstract] [Full Text]; Fujieda, Mikiya [Abstract] [Full Text]; Fyfe, John C. [Abstract] [Full Text]
G: Garbar, Christian H. [Abstract] [Full Text]; Gasser, Martin [Abstract] [Full Text]; Gburek, Jakub [Abstract] [Full Text]; Glaeser, Lisa [Abstract] [Full Text]; Grünfeld, Jean-Pierre [Abstract] [Full Text]; Guo, Lei [Abstract] [Full Text]; Gutiérrez, Antonio M. [Abstract] [Full Text]
H: Hammer, Markus H. [Abstract] [Full Text]; Hancock, Wayne W. [Abstract] [Full Text]; Hariharan, Sundaram [Abstract] [Full Text]; Harper, Steve J. [Abstract] [Full Text]; Hattori, Motoshi [Abstract] [Full Text]; Hildebrandt, Friedhelm [Abstract] [Full Text]; Holdsworth, Stephen R. [Abstract] [Full Text]; Hsu, Chi-yuan [Abstract] [Full Text]; Hsu, Chi-yuan [Abstract] [Full Text]; Hudkins, Kelly L. [Abstract] [Full Text]
I: Ideura, Terukuni [Abstract] [Full Text]; Ikeda, Yukio [Abstract] [Full Text]; Ingelfinger, Julie R. [Abstract] [Full Text]; Inui, Kiyoko [Abstract] [Full Text]; Ito, Sadayoshi [Abstract] [Full Text]
J: Jacobsen, Christian [Abstract] [Full Text]; Jo, Oak D. [Abstract] [Full Text]; Johansen, Kirsten L. [Abstract] [Full Text]
K: Karle, Stephanie M. [Abstract] [Full Text]; Kerjaschki, Dontscho [Abstract] [Full Text]; Kitching, A. Richard [Abstract] [Full Text]; Knebelmann, Bertrand [Abstract] [Full Text]; Kohagura, Kentaro [Abstract] [Full Text]; Koitabashi, Yasushi [Abstract] [Full Text]; König, Paul [Abstract] [Full Text]; Kraatz, Günter [Abstract] [Full Text]; Kronenberg, Florian [Abstract] [Full Text]; Kuen, Erich [Abstract] [Full Text]; Kurayama, Hideaki [Abstract] [Full Text]
L: Lai, Vesta S. [Abstract] [Full Text]; Lameire, Norbert H. [Abstract] [Full Text]; Lanzilotta, Salvatore Giovanni [Abstract] [Full Text]; Laskowski, Igor A. [Abstract] [Full Text]; Lehmann, Manfred [Abstract] [Full Text]; Lemaire, Matthieu [Abstract] [Full Text]; Lesavre, Philippe [Abstract] [Full Text]; Lhotta, Karl [Abstract] [Full Text]; Liu, Ruisheng [Abstract] [Full Text]; Liu, Youhua [Abstract] [Full Text]; Lorenzo, Victor [Full Text]
M: Maas, Renke [Abstract] [Full Text]; Machet, Marie-Christine [Abstract] [Full Text]; Mackenzie, Ruth K. [Abstract] [Full Text]; Mallamaci, Francesca [Abstract] [Full Text]; Mann, Johannes F. E. [Abstract] [Full Text]; Manno, Carlo [Abstract] [Full Text]; Mathieson, Peter W. [Abstract] [Full Text]; McCulloch, Charles E. [Abstract] [Full Text]; Megged, Orli [Abstract] [Full Text]; Miller, Judith A. [Abstract] [Full Text]; Moestrup, Søren K. [Abstract] [Full Text]; Morita, Hiroyuki [Abstract] [Full Text]; Moritz, Karen M. [Abstract] [Full Text]; Mortier, Siska [Abstract] [Full Text]; Müller, Gerhard A. [Abstract] [Full Text]
N: Nabarra, Bernadette [Abstract] [Full Text]; Newman, Geoffrey R. [Abstract] [Full Text]; Neyer, Ulrich [Abstract] [Full Text]; Noël, Laure-Hélène [Abstract] [Full Text]; Nomura, Hideki [Abstract] [Full Text]; Norgan, Vicki A. [Abstract] [Full Text]; Nortier, Joëlle L. [Abstract] [Full Text]; Nowacki, Wojciech [Abstract] [Full Text]
O: O’Hare, Ann M. [Abstract] [Full Text]; Omata, Ken [Abstract] [Full Text]
P: Passlick-Deetjen, Jutta [Abstract] [Full Text]; Paul, Leendert C. [Abstract] [Full Text]; Persson, A. Erik G. [Abstract] [Full Text]; Pirsch, John D. [Abstract] [Full Text]; Pollock, Fiona M. [Abstract] [Full Text]; Pratschke, Johann [Abstract] [Full Text]; Pusey, Charles D. [Abstract] [Full Text]
R: Raas-Rothschild, Annick [Abstract] [Full Text]; Ramos, Emilio [Abstract] [Full Text]; Reynolds, John [Abstract] [Full Text]; Riegel, Werner [Abstract] [Full Text]; Riegler, Peter [Abstract] [Full Text]; Rinat, Choni [Abstract] [Full Text]; Ring, Avi [Abstract] [Full Text]; Risch, Kirsten [Abstract] [Full Text]; Ritter, Thomas [Abstract] [Full Text]; Ritz, Eberhard [Abstract] [Full Text]; Ronner, Vera [Abstract] [Full Text]; Rossini, Michele [Abstract] [Full Text]; Roth, David [Abstract] [Full Text]; Ru Huang, Xiao [Abstract] [Full Text]; Rush, David [Abstract] [Full Text]
S: Salama, Alan D. [Full Text]; Saleem, Moin A. [Abstract] [Full Text]; Salido, Eduardo [Full Text]; Salmon, Isabelle J. [Abstract] [Full Text]; Salvatore Malatino, Lorenzo [Abstract] [Full Text]; Satchell, Simon C. [Abstract] [Full Text]; Sayegh, Mohamed H. [Abstract] [Full Text]; Sayegh, Mohamed H. [Full Text]; Schaub, Thomas P. [Abstract] [Full Text]; Schena, Francesco Paolo [Abstract] [Full Text]; Schnuelle, Peter [Abstract] [Full Text]; Scholey, James W. [Abstract] [Full Text]; Schröder, Grit [Abstract] [Full Text]; Schwenger, Vedat [Abstract] [Full Text]; Segerer, Stephan [Abstract] [Full Text]; Shapira, Eli [Abstract] [Full Text]; Shelden, Eric A. [Abstract] [Full Text]; Shen, Xiaohua [Abstract] [Full Text]; Shih, Nengjen Remi [Abstract] [Full Text]; Smith, Jennifer [Abstract] [Full Text]; Starling, Randall C. [Abstract] [Full Text]; Stayner, Cherie [Abstract] [Full Text]; Sugawara, Akira [Abstract] [Full Text]; Sugenoya, Youichi [Abstract] [Full Text]
T: Taal, Maarten [Abstract] [Full Text]; Takahashi, Katsuhito [Abstract] [Full Text]; Takeuchi, Kazuhisa [Abstract] [Full Text]; Tang, Shiow-Shih [Abstract] [Full Text]; Taniyama, Yoshihiro [Abstract] [Full Text]; Tegzess, Adam [Abstract] [Full Text]; Tilney, Nicholas L. [Abstract] [Full Text]; Tipping, Peter G. [Abstract] [Full Text]; To, Catherine [Abstract] [Full Text]; Tooke, John E. [Abstract] [Full Text]; Topley, Nicholas [Abstract] [Full Text]; Torres, Armando [Full Text]; Tripepi, Giovanni [Abstract] [Full Text]; Turner, Amanda L. [Abstract] [Full Text]
U: Ueki, Noboru [Abstract] [Full Text]; Uetz, Barbara [Abstract] [Full Text]
V: Van de Voorde, Johan [Abstract] [Full Text]; van der Heide, Jaap Homan [Abstract] [Full Text]; van der Woude, Fokko Johannes [Abstract] [Full Text]; Vanherweghem, Jean-Louis [Abstract] [Full Text]; Verburgh, Cornelis A. [Abstract] [Full Text]; Verroust, Pierre J. [Abstract] [Full Text]; Vienne, Anne R. [Abstract] [Full Text]; Volk, Hans-Dieter [Abstract] [Full Text]; von Eckardstein, Arnold [Abstract] [Full Text]; Von Ruhland, Christopher [Abstract] [Full Text]
W: Weir, Mattthew R. [Abstract] [Full Text]; Wilhelm, Markus J. [Abstract] [Full Text]; Williams, Geraint T. [Abstract] [Full Text]; Williams, John D. [Abstract] [Full Text]; Willnow, Thomas E. [Abstract] [Full Text]; Winn, Michelle P. [Full Text]; Wintour, E. Marelyn [Abstract] [Full Text]
Y: Yamabe, Hideaki [Abstract] [Full Text]; Yamada, Akira [Full Text]; Yamamura, Hisako [Abstract] [Full Text]; Yanagawa, Norimoto [Abstract] [Full Text]; Yang, Junwei [Abstract] [Full Text]; Yoshimura, Ashio [Abstract] [Full Text]
Z: Zhang, Shao-Ling [Abstract] [Full Text]; Zhou, Jing [Abstract] [Full Text]; Zoccali, Carmine [Abstract] [Full Text]